*The SmartSPMTM 1000 Scanning Probe Microscope is the first 100% automated system that offers it's cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.
 Automation of Operation / Ease of Use
- SmartSPM is capable of testing the cantilever's reflective coating before starting measurements by mapping the distribution of the cantilever's oscillation amplitude. In addition, after the mapping is done, the operator can manually choose the most appropriate position of the laser spot on the cantilever based upon his specific measurement requirements.
- The motorized sample positioning in the horizontal plane allows researchers to easily find the surface area where the scanning is to be done.
- In the automatic mode the operator only needs to specify the main probe parameters and scan area. SmartSPM will then automatically perform the full system adjustment, engage the probe with the sample surface and start scanning.
- The minimal learning period and the high speed initialisation of measurements (less than 5 minutes!) makes SmartSPM the perfect solution for multi-user facilities.
- Both the embedded scripting language (Lua) and DSP programming macro language let the user personalize his SPM experience by extending the SmartSPM software with his custom program extensions in such categories as scanning, force curves, nanolithography, high-throughput screening (HTS) and more.
 Resolution / Stability / Accuracy
- The safe and fast tip-sample engagement procedure makes it possible to protect even very sharp fragile tips from damage. Due to the availability of a true non-contact scanning mode it is possible to measure delicate and mechanically sensitive samples. The unique smart scanning procedures allow the user to obtain high quality images on very challenging objects.
- Outstanding mechanical stability makes it possible to get high quality atomic resolution images without any vibration isolation tables. This is of extreme importance for the integration of the AFM with optical facilities on top of an optical table.
Fast Scanning
- The SmartSPM fast scanner has very high resonance frequencies (resonant frequencies are 7kHz in XY & 15kHz in Z), which make it possible to significantly increase the scanning speed without sacrificing the image quality. This is done using standard cantilevers.
- An advanced digital controller equipped with optimized scanning control algorithms allows for decrease in the phase lag, overshooting and ringing during the scanning process, ensuring that the quality of the image remains the same even at higher speeds and during online speed changes.
- The novel proprietary MFM imaging mode allows the user to obtain the magnetic profile of the sample at outstanding speed.
All SPM Modes Included Plus Nanolithography
- Kelvin Probe Microscopy, Piezoresponse Force Microscopy, Nanolithography and Nanomanipulation are all included in the basic package!
Optical Access / Upgrade to AFM-Raman
- The SmartSPM design provides open access to the sample enabling use of upright optics with 100x objective (NA = 0.7) and side optics with 20x objective (NA = 0.42). This allows for easy integration with Raman spectrometers.
- The possibility of having not only top optical access, but also side optical access enables laser exposure with polarization and light collection reflected from the sample surface. This is extremely important for TERS (Tip Enhanced Raman Scattering) and scattering SNOM experiments.
- AIST-NT’s AFM head includes a 1300nm registration laser, which eliminates any cross-talk artifacts with the most popular Raman lasers up to 1064 nm. The IR registration laser also allows for work with visible light-sensitive semiconductor and biological samples.
For more information on SmartSPM 1000 visit the AIST-NT website at:
http://www.aist-nt.com/products/smartspm/
Or download the SmartSPM 1000 product brochure from:
http://www.aist-nt.com/wp-content/uploads/2010/02/smartspm_en_2010_01_19.pdf
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