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Surface Analysis
Scanning Probe Microscopes
Thin Film Metrology

Semiconductor Materials

Mi-Net Technology is the UK distributor for AIST-NT. With over 15 years experience in combined AFM/SPM/Raman Spectroscopy, AIST-NT focus on innovative research and development of advanced integrated scanning systems for nanotechnology. Please visit http://www.aist-nt.com/ for more information.

Mi-Net Technology is the UK distributor for Sentech GmbH of Germany. SENTECH Instruments GmbH develops, manufactures and sells advanced quality instrumentation for Thin Film Metrology. Please visit www.sentech.com for more information.

Scanning Probe Microscopes

Mi-Net Technology Ltd is the UK distributor for AIST-NT. The SmartSPMTM 1000 Scanning Probe Microscope is the first 100% automated system that offers it's cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.

Thin Film Metrology

Mi-Net Technology is the UK distributor for Sentech GmbH of Germany. SENTECH Instruments GmbH develops, manufactures and sells advanced quality instrumentation for Thin Film Metrology. Ellipsometers (laser ellipsometer, spectroscopic ellipsometer) and reflectometers for the measurement of thickness, refractive index, absorption index and other material properties of single thin films and layer stacks.
 
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