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Surface Analysis
Scanning Probe Microscopes
Thin Film Metrology
Film Thickness Probe
FTPadvanced
RM1000 Reflectometer
RM2000 Reflectometer
Laser Ellipsometers
SE400
SE500adv CER
SE300
Spectroscopic Ellipsometers
SENresearch
SENDIRA
SENDURO®
SENpro
SGME-SENresearch
SpectraRay II
Ellipsometers and reflectometers for industrial quality control
SENDURO®
SE800GS
FTPadv Inline
SE801
SE400 B
SE300
Ellipsometers and Reflectometers for Photovoltaics
SE 400adv PV
SE 800 PV
RM 1000 PV
FTPadv Inline
Sensol M
Sensol H
Sensol V
Software
SpectraRay II
SpectraRay II - Anisotropy
FTPadv EXPERT

Thin Film Metrology

Mi-Net Technology is the UK distributor for Sentech GmbH of Germany. SENTECH Instruments GmbH develops, manufactures and sells advanced quality instrumentation for Thin Film Metrology. Please visit www.sentech.com for more information.

Film Thickness Probe

Film Thickness Probe for measurement of film thickness and optical constants of transparent and semitransparent films.

FTPadvanced
RM1000 Reflectometer
RM2000 Reflectometer
FTPadv EXPERT
Laser Ellipsometers and CER

SE 400adv
SE 500adv CER

Spectroscopic Ellipsometers

SENresearch
SENDIRA
SENDURO
SENpro
SGME-SENresearch

Ellipsometers and Reflectometers for Industrial Quality Control

SENDURO
SE 800 GS
FTPadv Inline
SE 801
SE 400 B

Ellipsometers and Reflectometers for Photovoltaics

SE 400adv PV
SE 800 PV
RM 1000 PV
FTPadv Inline
SenSol M
SenSol H
SenSol V

Software

FTPadv EXPERT
SpectraRay II
SpectraRay II - Anisotropy

 
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