laser ellipsometer for Si wafer based solar cells, measures AR coatings on textured solar cells.
spectroscopic ellipsometer, measures single films and layer stacks on textured silicon solar cells.
Reflectometer, measures film thickness of AR coatings on textured solar cells.
Measurement system for inline monitoring of thin film solar cell production.
Manual mapping system with multiple sensor platform for thin film solar cells.
Horizontally configured computer controlled mapping system with multiple sensor platform.
Vertically configured computer controlled mapping system with multiple sensor platform.
