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Surface Analysis
Scanning Probe Microscopes
Thin Film Metrology
Film Thickness Probe
FTPadvanced
RM1000 Reflectometer
RM2000 Reflectometer
Laser Ellipsometers
SE400
SE500adv CER
SE300
Spectroscopic Ellipsometers
SENresearch
SENDIRA
SENDURO®
SENpro
SGME-SENresearch
SpectraRay II
Ellipsometers and reflectometers for industrial quality control
SENDURO®
SE800GS
FTPadv Inline
SE801
SE400 B
SE300
Ellipsometers and Reflectometers for Photovoltaics
SE 400adv PV
SE 800 PV
RM 1000 PV
FTPadv Inline
Sensol M
Sensol H
Sensol V
Software
SpectraRay II
SpectraRay II - Anisotropy
FTPadv EXPERT

Software
SpectraRay II

SENTECH’s comprehensive software for spectroscopic ellipsometry.

SpectraRay II - Anisotropy

SpectraRay Anisotropic Sample Analysis Software for Spectroscopic Ellipsometry.

FTPadv EXPERT

SENTECH’s software for measuring film thickness and refractive index.
 
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