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SGME -SENresearch

Spectral Generalized Magneto-Optical Ellipsometer.
Combined Kerr spectroscopy, MOKE, spectroscopic ellipsometry in one measurement.

Applications

  • Thin magnetic films
  • Multi-layer stacks
  • Multi-ferroic materials
  • Spin-tronics
  • Magnetic nano-materials
  • New magnetic materials
            

Product Description

The SGME-SENresearch is the ideal tool for the characterisation of dielectric and magnetic properties of bulk materials, thin films and layer stacks from DUV to NIR. The SGME-SENresearch combines Kerr spectroscopy, MOKE and spectroscopic ellipsometry in one easy automated measurement.

The SGME controller with an embedded touch screen PC utilizes a magenetic lock-in technique to detect spectroscopic signals with a precision of up to 10-5. The Step Scan Analyzer operation mode of this ellipsometer is perfectly suited for the implementation of this technique.

Low field and high field water cooled magnetic heads are available to serve a wide range of different applications. Alternatively a high end differentially pumped UHV He cryostat is available. It is perfectly matched to the magenetic field heads allowing a negligible impact of cryostat windows and magnetic field to the ellipsometric measurements.

The SGME-SENresearch ellipsometer is run by the comprehensive software SpectraRay and the SGME software. The software package includes all necessary items for data acquisition, modelling, fitting and reporting.

Typical applications include the analysis of single films and multi-layer stacks of magnetic materials, magnetic micro- and nanostructions. Vector magnetometry can be used to determine the angular deviation of the magnetization with respect to the external applied field in ultra thin magnetic films. The measurement of the degree of spin polarization is extremely important for spintronics (spin valve, spin FET).

Specifications

Measurement PrincipleSpectroscopic generalized magneto-optical ellipsometry utilizing magnetic lock-in technique.
Measured ValuesVoigt parameters, orinetation of magnetization, spin polarization, thickness, n, k.
Spectral Range190-930nm (up to 1700nm optional).
Magnetic Field40mT, optional 0.5lT
Sample SizeTyp. 12x12mm2 at 40mT.
Controller, PCSGME controller with touchscreen embedded PC, micro-controller units for automated measurements.
SoftwareSpectraRay, SGME operations and analysis software.
OptionsHigh field magnetic head, NIR extension (1700nm), High end differentially pumped He cryostat.

Please contact us for more information.

  
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