variable angle spectroscopic elliposmeter family for research and development with wide spectral range
190 nm –2500 nm.
SENDIRA
The SENDIRA covers the infrared spectral range from 1,7 µm to 25 µm ( 6000 cm-1 to 400 cm-1) with FT IR precision and high resolution. The SENDIRA provides detailed chemical, mechanical, electrical and optical information on complex layer systems. With the SENDIRA the investigation of new layer materials like organic conductors, OLEDs and polymers in the spectral range of vibrational spectroscopy offers excellent results.
SENDURO®
automated spectroscopic ellipsometer with predefined applications for multi-layer analysis.
SENpro
cost effective, variable angle spectroscopic ellipsometer for standard applications
370 nm - 1050 nm
SGME-SENresearch
The SGME-SENresearch is the ideal tool for the characterisation of dielectric and magnetic properties of bulk materials, thin films and layer stacks from DUV to NIR. The SGME-SENresearch combines Kerr spectroscopy, MOKE and spectroscopic ellipsometry in one easy automated measurement.
SpectraRay II
SENTECH’s comprehensive software for spectroscopic ellipsometry includes a large integrated package of modeling, simulation, and fitting programs in order to support customers with successful processing even of complex tasks.
