2D Beam Shaping X-ray Optics


*Single reflection optics - Improved efficiency and ease of alignment compared to double reflection Montel optics.

The introduction of multilayer optics in the late seventies allowed a tremendous gain in the focalization of x-rays, enabling the development of innovating x-ray based techniques for in lab material analysis.



History

The development of x-ray analytical applications and the requirement for better sample illumination accelerated the development of x-ray beam conditioning optics with first the introduction of 1D beam shaping optics and then in the late nineties the 2D beam shaping optics. The two dimensional beam shaping was first achieved by the combination of two 1-dimensional focusing optics in the Montel geometry.

While enabling an efficient 2-dimensional focalization, Montel optics are facing limitations due to the flux loss at each reflection and difficulty to achieve advanced geometries. X-ray multilayer optics manufacturers have put in tremendous efforts up to now to push this concept to its limit.

An innovative single reflection optical design

Xenocs came to the market in 2002 with a proprietary innovative single reflection optical design to overcome these limitations. With the introduction of the FOX2D product line, Xenocs proposed a versatile solution with significant flux gain due to its single reflection concept compared to traditional Montel design.

FOX3D product line: Unmatched performance

With the recent introduction of the FOX 3D product line, based on its proprietary replication technology, Xenocs is moving a step further in performance by enabling the production of new optical designs with unmatched performances.

FOX 3D optics are based on a truly aspheric design providing high precision beam shaping with ultimate performances.

A new standard for high performance

Hundreds of research groups around the world and renowned Original Equipment Manufacturers of the x-ray analytical market trust Xenocs to provide them with the best solution to fulfill their requirements. With its extended experience and customer references, Xenocs is definitely imposing single reflection optics as the new standard for high performance x-ray optics for the analytical industry.

Discover our product range

Please have a look through this page to learn more about our product range or go to our applications section to find the right product for your application and get customer testimonials.

High Flux Optics
ModelBeam size at focus (mm) with 60 µm sourceDivergence (mrad)Typical application
FOX 3D CU 14-390.19 x 0.195.4Protein crystallography, Powder diffraction
FOX 3D CU 12-530.3 x 0.33Protein crystallography (Long Unit Cells), Powder diffraction
FOX 3D MO 10-310.13 x 0.134Small molecule crystallography, High pressure diffraction
FOX 3D AG 10-300.13 x 0.133Small molecule crystallography ,High pressure diffraction
FOX 3D CR 8-300.20 x 0.206Protein crystallography (S-SAD) ,Stress analysis
Small Spot Optics
ModelBeam size at focus (mm) with 60 µm sourceDivergence (mrad)Typical application
FOX 2D MO 25-250.08 x 0.085Small mollecule crystallography, High pressure crystallography
FOX 2D CU 25-250.08 x 0.085.3Protein crystallography, Micro Diffraction, Reflectometry
FOX 3D CU 21-21 HC0.08 x 0.0870 x 35Rapid x-ray Reflectometry (full beam), Scanning x-ray Reflectometry (with slit) ,Micro-XRF
FOX 3D CU 28-100.04 x 0.0417Stress Analysis, Micro-diffraction, Micro-XRF
FOX 3D CR 30-80.04 x 0.0417Stress Analysis, Micro-diffraction, Micro-XRF
Collimating Optics
ModelBeam size at focus (mm) with 60 µm sourceDivergence (mrad)Typical application
FOX 2D CU 12-INF1.2 x 1.21Small angle x-ray scattering, High resolution x-ray diffraction, Surface scattering, Thin film analysis (reflectometry stress), Microdiffraction on synchrotron
FOX 2D MO 25-INF0.85 x 1.30.5Small Angle x-ray Scattering, High Resolution x-ray Diffraction, Surface scattering
FOX 2D 12-60 L0.18 x 0.20.5 x 2High resolution diffraction, Small sample analysis
FOX 3D CU 12-INF1.1 x 1.50.8Small Angle x-ray scattering, High Resolution x-ray diffraction, Surface scattering, Thin film analysis (reflectometry stress)

Visit the Xenocs website for more information on GeniX: http://www.xenocs.com/products/2d-beam-shaping-x-ray-optics.html

 
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