Discover how to fully leverage the capabilities of spectroscopic ellipsometry at the SENTECH Thin Film Metrology Workshop 2026.
Ellipsometry is a highly sensitive optical technique used to analyse thin films by measuring key properties such as film thickness, refractive index, and optical constants. It works by observing how the polarisation state of light changes after interacting with a film-coated surface.
Spectroscopic ellipsometry extends this principle across a wide wavelength range, typically covering the ultraviolet (UV), visible (VIS), and near-infrared (NIR) regions. By capturing wavelength-dependent changes in polarisation, it enables detailed modelling of optical behaviour and accurate characterisation of single and multilayer thin-film structures.
Learn directly from SENTECH experts
Engage with application specialists and developers from SENTECH Instruments and deepen your understanding of modern thin-film measurement techniques. Participants are welcome to bring non-confidential samples for discussion and analysis.
What you can expect from the workshop
- Interactive lectures delivered by SENTECH application scientists
- Live demonstrations of the SpectraRay/4 software platform
- Practical hands-on sessions using real sample materials
- Networking opportunities, including an organised dinner event
- Collaborative problem-solving using participant sample cases
Topics covered
Sessions will include measurement strategies, instrument operation, workflow automation within SpectraRay/4, optical modelling techniques, and material dispersion analysis. The programme is suitable for both newcomers and experienced users working in thin-film characterisation.
Registration details
The participation fee is €500 per attendee, which includes access to all sessions and the networking dinner. PhD students are encouraged to apply, with a limited number of complimentary places available.
Places are limited, so early booking is strongly recommended.
A full agenda and registration form can be accessed via the following links:
Agenda – SENTECH Metrology Workshop 2026
Registration – SENTECH Metrology Workshop 2026
For more information use our contact form or contact sales@mi-net.co.uk.
View product information from our thin film metrology range here.
