Our surface & chemical analysis lab services are offered in partnership with our colleagues at Nanovea Europe. We are able to provide comprehensive measurement reports for your samples using techniques such as Infrared (IR) Spectroscopy, Chromatography, Electron Microscopy, Atomic Force Microscopy (AFM), and X-Ray Diffraction.

We can provide measurements based on ASTM and ISO standards or we can design custom tests for your specific requirements.

Urgent expedited testing is available on request. Additional tests are available so visit our Lab Testing Services web page for a full list.

Contact us today to discuss your needs.

Nanovea Inc are based in Irvine, a tech hub of Southern California. They have been redefining standards in quality control and materials development internationally for over a decade. Nanovea’s instruments can be found in renowned education and industrial organisations around the world.

Nanovea CB500 Mechanical Tester

Why Use Lab Testing?

  • Cost effective compared to purchasing equipment for your lab
  • Consult with the experts throughout the test process
  • Expedited services in case of urgent requirements
  • Test results can be used to justify funding applications
  • Lower risk as you can “try before you buy”


IR Spectroscopy

IR Spectral Analysis of known and unknown materials. Analysis performed with FTIR-ATR method without pre-treatment. Functional groups definition.



Qualitative/semi-qualitative identification of components in oils and organic materials subjected to tribological testing.

Electron Microscopy


Punctual microanalysis or elements map distribution.

Thermo-Gravimetric & Thermo-Volumic Analysis

TGA – With Nitrogen Flux or oxidative atmosphere. Range temperature (-90C, 500C). Minimum mass sample to test 10mg.

DSC – Qualitative/semi-quantitative identification of components in oils and organic materials subjected to tribological testing.

Atomic Force Microscopy (AFM)

High resolution AFM analysis for topology and advanced 3D information at sub nanoscale.

X-Ray Diffraction

X-ray diffraction on powder and massive samples.

X-ray diffraction data analysis.

Quantitive definition of the crystal composition (Rietveld method).

Residual stress definition.

If you need a quote or would like more information on this product then please get in touch

Other Products in Range

Other lab services available via our partners

Request Product Brochure
When is the best time to call