3D non-contact profilometers for collecting and analysing sample height data
We supply 3D non-contact profilometers from Nanovea of Irvine California. Nanovea combine advanced Chromatic Confocal technology with powerful software to gather and analyse detailed height data about a wide variety of sample types. With a single profilometry scan it is possible to obtain measurements such as 3D waviness, roughness, step height, film thickness through to advanced fractal analysis and particle characterization.
You can find out more on the Nanovea website here.
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