3D non-contact profilometers for collecting and analysing sample height data
We supply 3D non-contact profilometers from Nanovea of Irvine California. Nanovea combine advanced Chromatic Confocal technology with powerful software to gather and analyse detailed height data about a wide variety of sample types. With a single profilometry scan it is possible to obtain measurements such as 3D waviness, roughness, step height, film thickness through to advanced fractal analysis and particle characterization.
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