Registration is now open!
Join the SENTECH Thin Film Metrology Workshop and discover the power of ellipsometry
Date: 15 – 16 October 2025
Location: SENTECH Instruments GmbH, Adlershof-Berlin
Explore – Learn – Apply
Hands-on experience with real-world samples
Bring your non-confidential thin film samples and work side-by-side with SENTECH’s application and development experts. Discover how ellipsometry, transmission and reflectometry can enhance your measurement and characterisation capabilities.
Workshop highlights include,
- Interactive lectures by experts from SENTECH Instruments
- Live demonstrations using the SENTECH cutting-edge SpectraRay/4 software
- Hands-on practical sessions – apply techniques to your own samples
- Networking opportunities, including a hosted dinner
Over two days, this practical, hands-on workshop will cover topics such as,
- Fundamentals & practical introduction
- Advanced modelling
- Script programming for ellipsometry
- Real-world applications & advanced analysis
- Depolarisation & non-idealities
- Mueller matrix & scatterometry
- Ellipsometry with transmission and reflectometry
You will have an access-all-areas tour of the SENTECH thin film metrology labs, and a chance to share knowledge and network.
Registration & Questions
A full agenda and registration form are below. The workshop cost is 500 € per person, including the networking dinner. Don’t forget, students can apply for a free space!
Agenda – SENTECH Metrology Workshop 2025
Registration – SENTECH Metrology Workshop 2025
Don’t miss this unique opportunity to gain deep insights into thin film metrology, from fundamentals to advanced applications – and connect with leading experts in the field.
For more information use our contact form or contact sales@mi-net.co.uk.
Places are limited for this event, register as soon as possible! We look forward to seeing you at the workshop!
