Application Note - HD Kelvin Force Microscopy for AFM


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Related Product - NanoObserver Atomic Force Microscope

The following shows an images of graphene over Silicon Carbide (SiC).

Left image shows topography but graphene layers are not clearly distinguished due to height variation in the sample. However the right image which is obtained using HD-KFM clearly seperates both materials. The grey areas correspond with the SiC whereas the orange areas are covered with a monolayer of graphene.

Electric characterization with the atomic force microscope is coming under an increasing demand from the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or other new advances in the semiconductor industry. In this article from CS Instruments we have described some applications of surface potential characterization with HD-KFM that range from highly flat materials like graphene or molybdenum disulfide to rough samples like cleaved perovskite solar cells.