Setting the Benchmark in Optical Metrology: The SENTECH SENresearch 4.0 Spectroscopic Ellipsometer
The SENTECH SENresearch 4.0, a powerful, modular spectroscopic ellipsometer designed for cutting-edge thin film analysis. With the widest spectral range (190 nm to 3,500 nm). High spectral resolution to analyse thick films up to 200 µm thickness using **FTIR ellipsometry**. The SENresearch 4.0 delivers unmatched versatility across industries from microelectronics and glass coatings to display technology and more.
⭐ Meet the SENTECH SENresearch 4.0,
Widest spectral range (190 nm to 3,500 nm).
High spectral resolution for precise characterisation of Silicon films up to 200 µm thick, using FTIR ellipsometry.
Fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively.
Step Scan Analyser (SSA) principle ensures no moving optical parts during acquisition to guarantee stability and repeatability, even on challenging surfaces.
2C design enables full Mueller matrix measurements for deep insight into complex or anisotropic materials.
Flexible & Modular Design.
Motorised pyramid goniometer with adjustable angles from 20° to 100°.
Independent arm movement supports scatterometry and angle-resolved transmission.
Seamless integration with SENTECH SpectraRay/4 software for intuitive operation.
From semiconductor films, dielectric stacks, optical and structural (3D) analysis to anisotropic samples, the SENTECH SENresearch 4.0 sets the standards for accuracy and flexibility in spectroscopic ellipsometry.
More information on the product page here.
