ResiScope featured in Conductive Atomic Force Microscopy, Applications in Nanomaterials

Article uploaded on 17/11/2017
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Related Product - ResiScope Electrical Characterisation for AFM

We are pleased to announce that the CS Instruments ResiScope module for advanced conductive measurements with Atomic Force Microscopy will be featured in a new publication by Wiley-VCH. The ResiScope is featured in chapter XII of Conductive Atomic Force Microscopy, Application in Nanomaterials.

The inclusion of the ResiScope in this publication adds a further endorsement of the unique measurement qualities of this AFM module.

If you have an application or problem that we can help with please contact us. For those who are considering a purchase of the ResiScope we offer a free sample measurement and demonstration service.

Abstract

In this chapter we will describe the most advanced module for conductive measurements with Atomic Force Microscopy named ResiScope II, which allows to perform current/resistance measurements over 10 orders of magnitude (from 100 fA to 1 mA). By connecting ResiScope to a conductive tip, surfaces with both highly conductive and insulating domains can be mapped overcoming undesired side-effects like probe-induced local oxidation, bimetallic effect or melting of the conductive coating by Joule effect. Additionally it will be described the Soft ResiScope mode, that allows to carry out electrical characterization in intermittent contact (point by point) at regular scanning speeds (few lines per second). This module prevents the tip from wear due to continuous scanning in contact and is specially suitable for soft samples.

Author Information

Dr. Mario Lanza is a Young 1000 Talent Professor and group leader at the Institute of Functional Nano & Soft Materials, in Soochow University, China. He obtained his PhD in 2010 at the Electronic Engineering Department of Universitat Autonoma de Barcelona. In 2010 and 2011 he was postdoctoral scholar at Peking University in China, where he used the technique of conductive atomic force microscopy to characterize a wide range of two dimensional materials and nanowires. In 2012 and 2013 he was Marie Curie postdoctoral fellow at Stanford University, USA, where he used CAFM to study local defects in photoelectrodes for water-splitting solar cells.

Dr. Lanza has published more than 60 publications, most of them using the CAFM to study the nanoelectronic properties of different materials and devices. Furthermore, he developed different setups to enhance the capabilities of the CAFM, including an environmental chamber and ultra durable graphene-coated probe tips. Currently his research group is focused on the nanoscale electrical characterization of different devices, including field effect transistors, non-volatile memories and solar cells.