3D Non Contact Surface Profilers


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3D Non-Contact Profilometry

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Featured Application Note

Surface Roughness Of Concrete Using 3D Profilometry - In this application, the Nanovea JR25 portable profilometer is used to measure the surface of a concrete sample. Several surface parameters will automatically be calculated including the most common, Sa (average surface roughness). Read more...

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3D Non-Contact Profiler

Advantages | Instruments | In-line |Technique

Nanovea Profilometers are designed with leading edge Chromatic Confocal optical technology (axial chromatism) both ISO and ASTM compliant. The technique measures a physical wavelength directly related to a specific height without using any complex algorithms. This ensures accurate results for all surface conditions; unlike other techniques.

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Application Notes

Advantages of Nanovea Profilometers

Nanovea profilometers:

3D Non-Contact Profilometers

P3 | Automated Touchsceen ProfilometerP3 Profilometer

The P3 is a significant advancement with 3D non contact profilometry, providing automatic nano through micro surface roughness (ISO 25178) measurement and height data on nearly any material. The P3 will provide to a broader market in need of automatic nano through micro roughness data without the high cost associated with a complete Profilometer system. Input function includes: Area, Sample Size & Reflectivity. Output function includes: Roughness & False Color Height Map.

The P3 provides universities, small R&D units and quality control departments an affordable profilometry capability. In the case of quality control multiple P3 units can be used to quickly and efficiently check roughness.

Key instrument features:

  • Low price nano through micro surface roughness measurement (ISO 25178)
  • Fully automated with touchscreen
  • Ideal for universities, small R&D units and quality control
  • Compact design no outside cabling
  • Ideal for most materials

Jr-25 | Portable ProfilometerJR25 Portable Profiler

The Jr25 is the first truly portable high performance Profilometer of its kind. With an optional battery pack and carrying case, the Jr25 provides measurement capability rarely available during field study.

The Jr25 is designed to easily utilize leading edge optical pens using superior white light axial chromatism measurement. With a total weight less than 5.5 Kg, the operator can safely place the Jr25 onto the surface under inspection. The Jr25 has the ability to measure an area up to 25mm x 25mm, and depending on the optical pen a depth up to 27mm and resolution down to 5nm. Focusing of the surface is achieved manually with a smooth touch micrometer and 30 mm travel range. With a fully rotational, single axis, head the Jr25 has the ability to measure surfaces at difficult angles. Along with quick and ease of use, the Jr25 has been designed specifically for production environments where samples cannot be moved and open field studies. The pen scanning head of the Jr25 can also be used to integrate on automated arms and other equipment.

Key instrument features:

  • Weight less than 5.5kg
  • Footprint 20 x 30 x 17cm
  • 25mm x 25mm XY (50mm optional)
  • Vertical or horizontal scanning position
  • Full profilometer capability in a portable instrument


PS50 | Affordable Compact ProfilometerPS50 Compact Profiler

With a small footprint of 38 x 33 x 43cm the PS50 is an ideal solution where lab space and budget is limited. With 50mm XY stages it can replace old and redundant stylus and laser profilers.

The PS50 has handles on the side and can be ran by laptop so is easy to move if required. The sample stage area is 150mm x 150mm and open to accommodate larger samples and/or multiple samples. Optical pens can be quickly and easily swapped to give the widest measurement range possible.

Key instrument features:

  • Compact size
  • Cost effective and low cost of ownership
  • 50mm x 50mm XY stages
  • 150mm x 150mm sample XY clearance
  • Easy to use
  • Interchangeable optical pens

ST400 | Standard Profilometer With High Speed OptionST400 Standard Profiler

The ST400 is the standard profilometer from Nanovea. It has 150mm XY stages and and adjustable height clearance of up to 200mm. It can be equipped with an optical pen or high speed line sensor for high speed measurements that are 200 times faster than normal. It even has the option of adding a microscope and/or AFM.

As with all Nanovea profilometers the optical pens are easily interchangeable to allow for the widest possible measurement range. Larger custom stages are available as well as 360° rotating stages.

The large stage size and sample area clearance makes the ST400 ideal for automated measurements. Macros can be programmed and custom holders designed so that multiple samples can me measured at a time with minimal user intervention required.

Key instrument features:

  • 150mm x 150mm XY stages
  • Spacious sample area and adjustable z-clearance up to 200mm
  • Larger custom stages available including 360° rotating stages
  • Range of options available such as microscope, AFM and stages
  • High speed line sensor options for measurements 200 times faster

ST500 | High Speed Large Stage ProfilometerST500 High Speed Large Stage Profiler

The ST500 is a cutting edge instrument at the top of the Nanovea profilometer range. It has large 400mm XY stages with a maximum speed of up to 200mm/s. It can be equipped with a line sensor which measures 198 points simultaneously to offer extremely fast profilometry measurements across large areas and with no need for image stitching. In fact with a line sensor equipped the ST500 can measure up to 382,000 height points per second!

Unlike other technologies each point is a direct height measurement and no refocusing is required during the measurement. Measurements are extremely easy to set-up and minimal training is required.

As with the ST400 the ST500 has large sample clearance and adjustable z-clearance of up to 200mm for big samples. It has all the options of the ST400 such as attached microscope, AFM and custom stages.

Key instrument features:

  • 400mm x 400mm XY stages
  • Spacious sample area and adjustable z-clearance up to 200mm
  • Larger custom stages available including 360° rotating stages
  • Range of options available such as microscope, AFM and stages
  • High speed line sensor options for measurements 200 times faster
  • Fast stages combined with line sensor for measurement of up to 382,000 height points a second
  • Fast measurement of large areas with no need for image stitching or refocusing

HS2000 | High Speed Inspection & Precision Flatness MeasurementHigh Speed Inspection & Precision Flatness Measurement

The HS2000 with its granite base and air bearing stages provides superior stability at high speeds for flatness measurement. Specifications for flatness are the best in the industry with less than 1micron over the entire measurement area. The HS2000 provides automated inspection for quality control applications where speed (1m/s) and large areas or multiple measurements are critical. It comes with an enclosure and workstation to create a fully contained stand-alone instrument. The HS2000 equipped with a line sensor can inspect at speed of up to 200 times faster. Designed for high speeds, large area’s and flatness but also excellent for roughness measurements, combined with advanced automation features.

Key instrument features:

  • High speed
  • Precision flatness measurement
  • Advanced automation
  • User friendly and easy to use
  • Rigid and stable structure with granite base
  • Customisable options


In-line | Continuous & Triggered In-Line InspectionContinuous & Triggered In-line Inspection

Using in-line inspection (POINT or LINE SENSORS) Nanovea’s unique in-line software package can measure and analyze–Live–roughness and texture parameters meeting standards for up to 8 points sensors or up to 4 line sensors. The software has many features including pass and fail criteria specific to each sensor or average of all sensors. Acquisition rates of more than 1,300,000 points per seconds. This is ideal for any film/paper sheet measurements and other in-line applications. Nanovea provides integration support including specific mounting structure.

Key instrument features:

  • Multi point or line Sensors
  • Continuous or triggered inspection
  • Any material
  • User friendly and easy to use
  • Superior in-line accuracy
  • Customisable options

The Technique

The Chromatic Confocal technique uses a white light source (LED) that passes through a series of lenses, called an optical pen, which has a high degree of chromatic aberration. The refractive index of the lenses will vary the focal distance of each wavelength of the white light. In effect, each separate wavelength of the white light will focus at a different distance from the optical pen, creating the measurement range. When a surface of interest is within the measurement range a single wavelength of the white light will be in focus while all others will be out of focus. The white light is then reflected back through the optical pen, then through a pin hole filter that allows only the focused wavelength to pass through to a CCD spectrometer. The CCD will indicate the wavelength in focus, which corresponds to a specific distance for a single point. The physical wavelength measured uses no algorithms providing the highest accuracy independent of form, roughness level, illumination and measurement speed. There is no special leveling procedure required. And while others make claims of resolutions Nanovea provides high accuracy.

White Light Axial Chromatism

Chromatic Confocal Measurement

Chromatic Confocal by design ensures the highest accuracy of all optical techniques. Specifically when measuring surfaces that are geometrically complex (randomly rough surfaces). Other techniques are subject to many error sources that are simultaneously present and it is not possible to remove or compensate for them or even to estimate their combined influences. The Profilometers offer high accuracy across the widest range of materials and surfaces conditions including tissues, biomaterials, polymers, plastics, metals, composites and ceramics. As an additional measurement signal to the height data, the technique also provides reflection intensity which can be used for highlighting features not seen by height variations. It can also be used to quantitatively measure variation of surface reflectivity.

Surface Measurements