The JR25 profilometer from Nanovea allow you to take the power of a desktop profilometer directly to your sample. Ideal for measuring samples that are difficult to move or for labs where you need to pack your profilometer away after use to save space.

Also sold to customers where the sample must remain stationary during measurements. Typical examples include powders and samples submerged in liquid.

Equipped with a 25mm x 25mm stage with interchangeable measurement sensors allowing measurement of a wide range of sample geometries both dull and reflective in finish.

Nanovea Inc are based in Irvine, a tech hub of Southern California. They have been redefining standards in quality control and materials development internationally for over a decade. Nanovea’s instruments can be found in renowned education and industrial organisations around the world.

Nanovea CB500 Mechanical Tester

Key Features

  • Fully portable weighing under 5.5kg with convenient carry case
  • 25mm x 25mm top down sample stage where the sample remains stationary
  • 2D and 3D measurement
  • Robust and easy to use
  • Can measure both flat and curved samples using interchangeable measurement sensors
  • Can measure dull and reflective samples
  • Able to approach samples from difficult angles
  • Measurement across full stage range with no need for image stitching or refocusing
  • Powerful analysis software

Surface Measurements


3D non-contact profilometry can be used across a range of different applications to provide vital height data about your samples.

If you need a quote or would like more information on this product then please get in touch

How It Works

Chromatic Confocal technique uses white light that passes through a series of lenses with high degree of chromatic aberrations. Each wavelength will focus at a different distance creating the vertical measurement range. When a surface of interest is within the measurement range a single wavelength of the white light will be in focus while all others will be out of focus. Only the focused wavelength will pass through the pin hole filter to reach the CCD spectrometer. The physical wavelength measured corresponds to a vertical position. No complex algorithms are used to obtain the height value ensuring accurate results for all surface conditions unlike other techniques.


Technical Specification

JR25 Base Specifications
X-Y Stage Travel 200mm x 150mm
Z-Axis Travel 50mm motorized (extra manual z-clearance is available)
X-Y Max Speed 40mm/s
Sensor Specifications
Standard Speed  PS1 PS2 PS3 PS4 PS5 PS6
Max Height Range 110µm 300µm 1.1mm 3.5mm 10mm 24mm
Working Distance 3.35mm 10.8mm 12.0mm 16.2mm 25.9mm 20mm
Lateral X-Y Accuracy 0.9µm 1.2µm 2.0µm 3.0µm 7.0µm 8.0µm
Height Repeatability* 1.2nm 2.2nm 3.4nm 17nm 31nm 41nm

*Fixed point measurement on glass. Ra average height variation for 1,200 points (100 sampling).

Other Products in Range

Other instruments in the Nanovea profilometer range.

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