The HS2000 profilometer from Nanovea combines a granite base, high speed profilometry and a large sample stage to provide superior stability when measuring flatness of large samples.
Equipped with a large 400mm x 500mm stage the HS2000 can measure height points across up to 500mm per second with no need for image stitching! Ideal for quality control applications where speed, sample size and automation are important.
Nanovea Inc are based in Irvine, a tech hub of Southern California. They have been redefining standards in quality control and materials development internationally for over a decade. Nanovea’s instruments can be found in renowned education and industrial organisations around the world.
3D non-contact profilometry can be used across a range of different applications to provide vital height data about your samples.
Chromatic Confocal technique uses white light that passes through a series of lenses with high degree of chromatic aberrations. Each wavelength will focus at a different distance creating the vertical measurement range. When a surface of interest is within the measurement range a single wavelength of the white light will be in focus while all others will be out of focus. Only the focused wavelength will pass through the pin hole filter to reach the CCD spectrometer. The physical wavelength measured corresponds to a vertical position. No complex algorithms are used to obtain the height value ensuring accurate results for all surface conditions unlike other techniques.
|HS1000 Base Specifications
|X-Y Stage Travel
|200mm x 150mm
|50mm motorized (extra manual z-clearance is available)
|X-Y Max Speed
|Sensor Specifications – High Speed
|Max Height Range
|Height Repeatability Ra*
|Lateral Accuracy Of Each Point
|Acquisition Rate (points per second)
*Fixed point measurement on glass. Ra average height variation for 1,200 points (100 sampling).
Other instruments in the Nanovea profilometer range.
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