ResiScope Electrical Characterisation for AFM

ResiScope II Electrical Characterization AFM

ResiScope Featured In New CAFM Book!

We are pleased to announce that the CS Instruments ResiScope module for advanced conductive measurements with Atomic Force Microscopy will be featured in a new publication by Wiley-VCH. The ResiScope is featured in chapter XII of Conductive Atomic Force Microscopy, Application in Nanomaterials. Find out more here...

Featured Application Note

Local Oxidation Nanolithography of Titanium Thin Films - In this application note LON of 10 nm-thick titanium thin films, deposited onto alumina (isolating) substrates by Pulsed Laser Deposition technique, was performed with a 5500LS system implemented with a ResiScope module. Read more...

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ResiScope II Electrical Characterization AFM

Home > Testing and Analysis > ResiScope Electrical Characterisation for AFM

The ResiScope II is a unique system able to measure Resistance over 10 decades with a high sensitivity and resolution. It can be combined with several dynamic modes such as MFM/EFM (AC/MAC mode) or KFM single‐pass (AC/MAC III) providing several different sample characterisations on the same scan area.

The measurement is made by applying a DC bias between the sample and a conductive AFM probe (tip at virtual ground). The tip is scanning in contact mode using the laser deflection for the AFM feedback . As an independent measurement, the ResiScope II measures the sample resistance through the High Performance Amplifier (HPA).

What is ResiScope

What is ResiScope?

  • A dual measurement system
  • Resistance measurement
  • Current measurement (& IV spectroscopy)
  • Compatible with Oscillating mode (Tapping/AC mode)
  • Compatible with EFM/MFM or Single-pass KFM
  • Resistance 102 ohms to 1012 ohms (10 decades dynamic)
  • Output information : R, Log R, Current & I/V Spectroscopy


  • Photovoltaic
  • Semiconductors
  • Oxyde characterization
  • All conductive characterization


  • Easy to use
  • Automatic mode selection
  • Configurable outputs
  • Selectable output scale: R | Log R | Current


Resistance range10² Ω to 10^12 Ω
Current range (ResiScope mode)100 fA to 1mA
AFM compatibilityAgilent Technologies : 5100/5500/5500LS/5420/5600LS
CSInstruments : Nano-Observer
UHV : please contact us
Compatible AFM modeContact / Tapping / AC mode
EFM / MFM / KFM single-pass
Operating EnvironmentWindows® XP.SP3 Framework DotNet 3.5 SP1 One USB port available.
Power SupplyAC 100‐240V 47‐63Hz, 1A The appliance must be properly grounded.
Weight (net)2kg




Resiscope / AC Mode / KFM

Oxide Characterisation

Compatible with

For all information about ResiScope please visit the CS Instruments website at