The RM1000 reflectometer is a robust easy to use tool that is very popular amongst our customers performing quality control or basic research.
A spectral range of 430nm – 930nm (optionally 200nm – 930nm) allows measurement of both thin and thick films and simple layer stacks.
Both flat and curved samples with smooth or rough surfaces can be measured for thickness, refractive index and extinction coefficient.
SENTECH Instruments of Berlin have been manufacturing tools for thin film metrology and processing since 1990. They are a growing company with a reputation for high quality reliable equipment and excellent service.
SENTECH regularly document and publish work using their thin film metrology tools. We keep many of these resources on our website in the form of application notes or publications. These are a great way to learn more about what can be achieved with a Sentech tool.
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Other instruments in the SENTECH thin film metrology range.
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