The RM1000 reflectometer is a robust easy to use tool that is very popular amongst our customers performing quality control or basic research.

A spectral range of 430nm – 930nm (optionally 200nm – 930nm) allows measurement of both thin and thick films and simple layer stacks.

Both flat and curved samples with smooth or rough surfaces can be measured for thickness, refractive index and extinction coefficient.

SENTECH Instruments of Berlin have been manufacturing tools for thin film metrology and processing since 1990. They are a growing company with a reputation for high quality reliable equipment and excellent service. 

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Key Features

  • Spectroscopic reflectometry with spectral range 430nm – 930nm (optionally 200nm – 930nm)
  • Measurement of film thickness, refractive index and extinction coefficient
  • Robust and easy measurements
  • Measurement of single films between 5nm and 50µm thick plus simple layer stacks
  • Mapping options available
  • Measurement of flat or curved samples, rough or smooth
  • Comprehensive SENTECH materials library for efficient modelling

If you need a quote or would like more information on this product then please get in touch

Other Products in Range

Other instruments in the SENTECH thin film metrology range.

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