Thin Film Metrology
Measuring the properties of thin films
Thin film metrology is the measurement of thin film properties such as thickness and refractive index. Our thin film metrology tools from SENTECH Instruments can be used to measure simple single layers or complex layer stacks across a wide spectral range from DUV up to NIR. Both fixed angle and variable angle tools are available depending on the application and budget.
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Smartphone based optical tensiometer to measure the surface properties of materials
Fast and easy measurement of thin films with optional mapping
Industries
Our products are used in a range of industries worldwide
The design and fabrication of semiconductor devices within the wider...
Research and quality control in the pharmaceuticals and cosmetics industry...
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