The SE400adv ellipsometer is a single wavelength laser ellipsometer. A stabilized HeNe laser guarantees a precision of 0.1Å for thin film measurements of ultra thin single layers.
A manual goniometer allows measurement of film thickness, refractive index and extinction coefficient of single and multilayer stacks.
The SE400adv is designed to be easy to use and to provide fast measurements. In fact the speed of measurements allows users to perform repeating measurements for applications such as film growth tracking and end point detection. The measurement speed also makes sample mapping an attractive option.
SENTECH Instruments of Berlin have been manufacturing tools for thin film metrology and processing since 1990. They are a growing company with a reputation for high quality reliable equipment and excellent service.
SENTECH regularly document and publish work using their thin film metrology tools. We keep many of these resources on our website in the form of application notes or publications. These are a great way to learn more about what can be achieved with a Sentech tool.
Other instruments in the SENTECH thin film metrology range.
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