The SENDIRA infrared ellipsometer is specially designed to use FTIR. The table top instrument links to a commercial FTIR instrument to provide excellent precision and high resolution in the spectral range from 1.7µm – 25µm.
The spectroscopic ellipsometer is focussed on the vibrational spectroscopic analysis of thin layers.
Applications range from dielectric films, TCOs, semiconductors to organic layers.
SENTECH Instruments of Berlin have been manufacturing tools for thin film metrology and processing since 1990. They are a growing company with a reputation for high quality reliable equipment and excellent service.
Other instruments in the SENTECH thin film metrology range.
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