SENTECH SENDIRA FTIR Spectroscopic Ellipsometer

SENTECH SENDURO Automated Spectroscopic Ellipsometer

The SENDIRA infrared ellipsometer is specially designed to use FTIR. The table top instrument links to a commercial FTIR instrument to provide excellent precision and high resolution in the spectral range from 1.7µm – 25µm.

The spectroscopic ellipsometer is focussed on the vibrational spectroscopic analysis of thin layers.

Applications range from dielectric films, TCOs, semiconductors to organic layers.

SENTECH Instruments of Berlin have been manufacturing tools for thin film metrology and processing since 1990. They are a growing company with a reputation for high quality reliable equipment and excellent service.

Key Features

Spectral range of 1.7µm to 25µm
Measurement of thin film thickness, refractive index, extinction coefficient and related properties
Measurement of bulk materials, single layers and multi-layer stacks
Measurement of buried layers beneath layers that are not transparent in the visual range
Motorized goniometer for variable angle measurements
Low noise due to no moving parts with Step Scan Analyzer principle
Comprehensive SpectraRay/4 measurement software. One of the most powerful packages available on the market so please contact us for a demo
Easy operation for both experts and beginners
Comprehensive SENTECH materials library for efficient modelling