The SENpro ellipsometer is ideal for those requiring spectroscopic ellipsometry on a budget without compromising on measurement performance.
Determination of thickness and refractive index of single films and complex layer stacks with ease.
Measurements take place in the spectral range of 370nm to 1,050nm and a manual goniometer with 5° steps between 40° and 90° allows variable angles.
SENTECH Instruments of Berlin have been manufacturing tools for thin film metrology and processing since 1990. They are a growing company with a reputation for high quality reliable equipment and excellent service.
SENTECH regularly document and publish work using their thin film metrology tools. We keep many of these resources on our website in the form of application notes or publications. These are a great way to learn more about what can be achieved with a Sentech tool.
Other instruments in the SENTECH range of thin film metrology tools.
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