The SENpro ellipsometer is ideal for those requiring spectroscopic ellipsometry on a budget without compromising on measurement performance.

Determination of thickness and refractive index of single films and complex layer stacks with ease.

Measurements take place in the spectral range of 370nm to 1,050nm and a manual goniometer with 5° steps between 40° and 90° allows variable angles.

SENTECH Instruments of Berlin have been manufacturing tools for thin film metrology and processing since 1990. They are a growing company with a reputation for high quality reliable equipment and excellent service. 

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Key Features

  • Spectral range of 370nm to 1,050nm
  • Cost effective for the spectroscopic range
  • Manual goniometer with 5° steps across the 40° – 90° range
  • Low noise due to no moving parts with Step Scan Analyzer principle
  • Comprehensive SpectraRay/4 measurement software. One of the most powerful packages available on the market so please contact us for a demo
  • Easy operation for both experts and beginners
  • Comprehensive SENTECH materials library for efficient modelling

If you need a quote or would like more information on this product then please get in touch

Other Products in Range

Other instruments in the SENTECH range of thin film metrology tools.

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