SEMICON EUROPA 2025
In November 2025 we will make our yearly trip to Munich Germany for the SEMICON Europa conference. This is the 50th year of SEMICON in
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October 14, 2025
The SE400adv ellipsometer is a single wavelength laser ellipsometer. A stabilized HeNe laser guarantees a precision of 0.1Å for thin film measurements of ultra thin single layers.
A manual goniometer allows measurement of film thickness, refractive index and extinction coefficient of single and multilayer stacks.
The SE400adv is designed to be easy to use and to provide fast measurements. In fact the speed of measurements allows users to perform repeating measurements for applications such as film growth tracking and end point detection. The measurement speed also makes sample mapping an attractive option.
SENTECH Instruments of Berlin have been manufacturing tools for thin film metrology and thin film processing since 1990. They are a growing company with a reputation for high quality reliable equipment and excellent service. Their tools are used in applications such as semiconductors, microsystems, photovoltaics, nanotechnology and materials research.
The SE400adv laser ellipsometer can be equipped with optional extras:
All options are modular so can be purchased at a later date if needed.
SENTECH regularly document and publish work using their thin film metrology tools. We keep many of these resources on our website in the form of application notes or publications. These are a great way to learn more about what can be achieved with a Sentech tool.
Other instruments in the SENTECH thin film metrology range.
We’re here and ready to provide information and answers to your questions
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