The SENTECH SENDIRA is focused on the vibrational spectroscopic analysis of thin layers. Applications include:

Vibrational ellipsometry

Combine two powerful methods – ellipsometry and vibrational spectroscopy to gain valuable insights into optical and vibrational properties of materials at a surface or interface.

Measurement of n and k 

Reliable measurements to determine optical properties in the IR for IR optics. Draw meaningful conclusions, make predictions, and gain insights into the best layer and material designs for IR optics.

Identification of materials on opaque substrates

Allows you to explore the fundamental properties of matter in order to develop new materials for the  advancement of cutting edge technologies.

Determination of crystal modification

To provide fundamental insights into the structure and properties of your chosen materials.

Composition analysis

To guide the synthesis and modification of your materials to meet desired performance criteria.

Determination of impurities

Accurate and precise measurement of impurities for reliability in your experimental results.

Orientation of organic molecule chains

Gain a crucial understanding of optical and spectroscopic orientation of molecules vital to many leading edge applications in lab-on-a-chip, lifescience and bio-sensor applications.

Measurement of bond orientation

Accurately measure electronic, optical, and structural properties to clearly determine functionality in your applications.

Conductivity of films

Gain valuable information about the quality and performance of your materials for precise conductivity measurements.

Doping profiles

Enabling precise measurement and understanding of charge carrier concentration and electrical conductivity.